IRS datasheet, IRS pdf, IRS data sheet, datasheet, data sheet, pdf , International Rectifier, High and Low Side Driver, All High Voltage Pins On. IRS IC MOSFET DRVR HI/LO SIDE 16SOIC International Rectifier datasheet pdf data sheet FREE from Datasheet (data sheet) search for. n Floating channel designed for bootstrap operation. Fully operational to +V. Tolerant to negative transient voltage. dV/dt immune n Gate drive supply range.
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Logic supply offset voltage. Allowable offset supply voltage transient figure 2.
Typical ratings at other bias conditions are shown in figures 36 and Please refer to our Application Notes and DesignTips for proper circuit board layout. IGBT drivers with independent high and low side referenced output chan.
V LO Low side output voltage. V S High side floating supply offset voltage IR T J Junction temperature.
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For proper operation the device should be used within the recommended conditions. The thermal resistance and power dissipation ratings are measured. VBS Supply Current vs. Low side datasehet voltage.
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Additional information is shown in Figures 28 through The output drivers feature a high pulse current buffer stage designed for minimum driver cross-conduction. Ir113s S Storage temperature. Turn-Off Delay Time ns 50 0 0 Typ. T L Lead temperature soldering, 10 seconds. Low side fixed supply voltage.
Propagation delays are matched to simplify use in high frequency applications.
IRS Datasheet(PDF) – International Rectifier
Thermal resistance, junction to ambient. All voltage parameters are absolute voltages referenced to COM.
Turn-On Rise Time vs. Please refer to the Design Tip. Refer to Lead Assignments for correct pin configuration. Temperature Offset Supply Leakage Current? The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Tolerant to negative transient voltage.
Delay Matching Waveform Definitions 6 www. Logic inputs are compatible with.
International Rectifier Electronic Components Datasheet. Absolute maximum ratings indicate sustained limits beyond which damage to the device may occur. For proper operation the device should be used within the. The dynamic electrical characteristics are measured using the test circuit shown in Figure 3.
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Units Test Conditions 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 9.